Steveo
16th August 2005 - 02:58 PM
QUOTE
I think it's called LEEPL and is developed mainly in Japan.
That is interesting, I was completely unaware of that!
QUOTE (->
| QUOTE |
| I think it's called LEEPL and is developed mainly in Japan. |
That is interesting, I was completely unaware of that!
One thing to be careful of is secondary radiation (i.e., electrons) generated by primary radiation that is energetic enough to be ionizing (e.g., EUV, X-ray, electrons). This secondary radiation does most of the resist exposure, actually.
Thats exactly why the instructer for my EBL course suggested that possiblity, because you could use less energetic electrons with a lower voltage, and have less secondary radiation. Where I work uses the Raith 150, and it has a range of voltages from I think 0.1keV to 30keV. We usually operate at about 20keV, but it would be great if you could use a mask and have way less energetic electrons.
Apparently in germany with the Rith 150 they have got features down to 6nm in size, which isn't to bad at all.
Maybe there will be some lithographic revolution and it will catch up and be able to produce sub nanometer sizes, depending on the material being used. (if a molecule is larger than a nanometer you couldn't make sub nanometer features of course)
guiding_light
22nd August 2005 - 09:06 PM
Hi Steveo,
QUOTE
...you could use less energetic electrons with a lower voltage, and have less secondary radiation
I can't agree more. Naval Research Labs has used STM with really low voltages to expose resists. These low energy electrons go surprisingly far (tens of nanometers). These are the same energy as the usual secondary electrons which expose resist.
I am aware people have published sub-10 nm results but how repeatable can this be? Raith only guarantees down to
20 nm. If you do Monte Carlo simulations you can see how random and noisy these electrons really are.
Using DUV optical maskless (like Sigma 7300) to make a
nanoimprint template still seems like the best bet for now for the long term. I would expose and etch a negative photoresist like SU8 many times for example. Sigma 7300 is also way faster than the electron beam tools.
Steveo
22nd August 2005 - 10:14 PM
Your right, E-beam tools aren't the fastest, although from the info I have given is that some of the expensive, commerical ebeam systems can do small features very quickly.
Your right, the 6nm features probably aren't very repeatable, although even 25nm (on the Raith we have at my lab) isn't all that repeatable (because of crappy vibration insulation at the facility I am at.
I have only started in micro and nanofabrication in the last few months, so I am still a newbie at it.
Guest
10th September 2005 - 01:20 AM
Immersion makes 45 nm already possible. The "32 nm node" is commonly held to be 90-110 nm pitch anyway, a little less than half of today's design rules, but achievable with
ASML's 1700i tool, for example . So this definitely buys the industry time.
Empyre
10th September 2005 - 11:42 AM
Quote: "who needs 100 billion transistors on a chip anyhow?"
Windows 98 was written with the assumption that nobody would need more than 128 megs of ram, and slows down with more than 160 megs, and becomes unstable with more than 192 megs. Ye olde DOS made the assumption that nobody would ever need more than 640K ram. A decade or so earlier, it was stated by an expert that nobody would ever need more than 16K of memory.
The above quote will seem silly sooner that you might think.
???
10th September 2005 - 08:47 PM
QUOTE
Immersion makes 45 nm already possible. The "32 nm node" is commonly held to be 90-110 nm pitch anyway, a little less than half of today's design rules, but achievable with ASML's 1700i tool, for example . So this definitely buys the industry time.
I was looking for the price tag of this tool (ASML 1700i). Sometimes such a figure is published online.
Nikon's NSR-S609B is around $35 million, with an NA of 1.07 and throughput of 130 WPH.
guiding_light
11th September 2005 - 06:28 PM
QUOTE
I was looking for the price tag of this tool (ASML 1700i). Sometimes such a figure is published online. Nikon's NSR-S609B is around $35 million, with an NA of 1.07 and throughput of 130 WPH.
Actually I was surprised to find the cost published online. Usually, you read about it in interviews with executives complaining about the higher costs.
What is happening is as resolution requirements become finer, the CoO for maintaining the same throughput is growing rapidly.
The higher cost comes from more higher-quality optical components required, new materials, contamination maintenance, resolution enhancements, etc.
At the same time, it is harder to maintain the same throughput as resolution becomes finer, for a variety of reasons. Acid diffusion and line-edge roughness (the topic of the original post) are two of them. Multiple-exposure strategies are already being contemplated for the latest optical lithography tools. There is also shot noise for higher-energy quanta (like EUV/X-ray photons or electrons), which could worsen throughput.
Eventually tighter resolution requirements will make it impossible to continue this trend using these tools anyway. Only nanoimprint will survive at that point.
All the more reasons to break out of this trend early.
rough edge
28th September 2005 - 03:18 AM
guiding_light
29th September 2005 - 05:50 AM
The way line-edge roughness is affected by shot noise is this:
Typically we expect to have:
EUV dose = 5 mJ/cm^2: 14 photons in a 2 nm square
ArF dose = 25 mJ/cm^2: 240 photons in a 2 nm square
The Poisson statistics show 3s/avg = 3*sqrt(14)/14 = 81% for EUV
= 3*sqrt(240)/240 = 10% for ArF
Such large uncertainty means one can have 2 nm pixels which are randomly unexposed. At the feature edge where dose falls off, this effect is aggravated. This is also much worse for EUV than for ArF or DUV because fewer photons are used for exposure. This is the dose contribution to LER. It is a natural variation in the exposure dose.
For chemically amplified resists, each photon ultimately generates lots of acids. The acid number has much less shot noise but at the cost of resolution (more blur), since these acids have to diffuse.
For ionizing radiation, as I mentioned elsewhere, each EUV or X-ray photon generates an avalanche of electrons which in turn can diffuse and generate more acids which also diffuse. These two factors increase blur significantly.
guiding_light
29th September 2005 - 06:13 AM
QUOTE
Such large uncertainty means one can have 2 nm pixels which are randomly unexposed.
I should say such large uncertainty means large variation of local exposure of 2 nm pixels.
Guest
29th September 2005 - 07:56 AM
QUOTE
ArF dose = 25 mJ/cm^2: 240 photons in a 2 nm square
This should be 960 photons (each being 6.425 eV in energy) in a 2 nm square. This gives 3s/avg = 3*sqrt(960)/960 = 10% shot dose variation in exposing a 2 nm pixel, assuming every incident 193 nm photon is absorbed.
The quantum efficiency of absorption also needs to be taken into account. If the QE is much less than 100%, that could make the 3s/avg much higher. If 3s/avg is close to 100%, then the exposure of a 2 nm pixel is almost randomly 'on' or 'off', giving a direct dose contribution to the roughness of the line edge on a 2 nm scale.
Checking the EUV calculation for the target dose of 5 mJ/cm^2:
5 mJ/cm^2 = 3.125 *10^16 eV/cm^2 = 312.5 eV/nm^2 = 3.4 92 eV photons/nm^2. Therefore, in a 2 nm square, there is ~14 EUV photons. This gives 3s/avg = 3*sqrt(14)/14 = 81%, which again gives a random 'on' or 'off' even at 100% quantum efficiency.
guiding_light
29th September 2005 - 02:58 PM
The number of photons absorbed is also a function of depth in the photoresist. Hence by the same argument, the shot noise roughness should be worse at the bottom of a photoresist trench or hole, since fewer photons make it there.
nanopolis
29th September 2005 - 04:34 PM
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rough edge
29th September 2005 - 11:32 PM
You can get roughness just by developing straightforward PMMA e-beam resist. Of course chemically-amplified resists make things worse.
Polymer phase separation has been observed as a visible aspect of LER.
Aerial image quality is also important for e-beam lithography as
proximity effects have been shown to aggravate LER.
plasma_guy
3rd October 2005 - 03:03 PM
Plasma etching also worsens roughness in the masked material, after initially smoothing the photoresist. Very tricky stuff.
rough edge
5th October 2005 - 10:22 PM
QUOTE
Plasma etching also worsens roughness in the masked material, after initially smoothing the photoresist. Very tricky stuff.
I can see this happening if there are dense polymer aggregates in the photoresist which etch slightly slower than the rest of the photoresist. With longer etch time, this could result in a few nm difference.
guiding_light
10th November 2005 - 05:46 AM
Deep trench capacitors require larger and larger aspect ratios for smaller and smaller trenches. This will also impose some limits on lithography, at least for this DRAM technology.
Guest
21st February 2006 - 07:43 AM
guiding_light
19th June 2006 - 03:34 AM
QUOTE
The number of photons absorbed is also a function of depth in the photoresist. Hence by the same argument, the shot noise roughness should be worse at the bottom of a photoresist trench or hole, since fewer photons make it there.
Largest dose to size in literature is 36.8 mJ/cm^2. That's 25 photons/nm^2. 125 nm photoresist thickness. Apply the exponential attenuation. You see the picture.
mfp in Cu
17th July 2006 - 12:38 PM
The mean free path of an electron with Fermi energy of 7 eV in copper is ~39 nm.
http://hyperphysics.phy-astr.gsu.edu/hbase.../ohmmic.html#c2What does that mean? It seems awfully a long distance (expecting a few nm or so).
guiding_light
18th July 2006 - 02:49 PM
QUOTE
The mean free path of an electron with Fermi energy of 7 eV in copper is ~39 nm.
http://hyperphysics.phy-astr.gsu.edu/hbase.../ohmmic.html#c2What does that mean? It seems awfully a long distance (expecting a few nm or so).
The related links at that site give additional info. The mean free path is long because there is very little electron scattering into states close to the Fermi level. The electric field probably gives micro-eV energy difference. This is already smaller than thermal excitation (~0.026 eV at room temperature).
Impact ionization (which generates secondary electrons from primary ones) involves energy differences at least on the order of the Fermi energy, so for metals, the mean free path is small, but for insulators, where the density of states is much less, the mean free path is also large (observed to be > 10-20 nm).
guiding_light
19th July 2006 - 01:03 AM
McCord and Pease, JVST B vol. 6, p. 293-296 (1988).
Apparently 20 eV electrons from an STM can go through 20 nm PMMA.
guiding_light
19th July 2006 - 05:24 AM
http://www.cs.vu.nl/~nsilvis/microeng.pdfFigure 3 shows spread of secondary-electron driven contamination growth. 20 nm spread at the surface is already visible.
eh
20th July 2006 - 06:23 AM
http://scitation.aip.org/getabs/servlet/Ge...=cvips&gifs=YesMore data from X-ray exposure on gold substrate.
The electrons seemed to move 50 nm from the resist-substrate interface into the resist.
These are mostly the secondary electrons (<10 eV) which have longest mean free path as well.
Neil Farbstein
30th July 2006 - 05:51 AM
QUOTE (John Larkin+Aug 23 2004, 07:21 PM)
Or just admit that something in the 40 nm range is as far as ICs are
going to go, Moore's Law has at last hit the wall, and who needs 100
billion transistors on a chip anyhow?
John
You dont want a really powerful computer that can design an engine that never knocks or breaks down. If you hit the wall you're going to get hurt John.
fivedoughnut
30th July 2006 - 06:25 AM
Has anyone thought of going 3-D?......We now have the technology for 3-D printing why not apply it to processors?...although cooling these buggers will need a little imagination.
3D is here
31st July 2006 - 01:40 PM
3D technology already being used through chip stacking. Maybe it's a cheat but definitely more transistors per unit area.
not the end I hope
5th August 2006 - 03:58 PM
http://www.reed-electronics.com/electronic.../CA6351743.htmlQUOTE
ASML Holding NV has debuted what it says is the chip industry's most advanced lithography system, the ASML TWINSCAN XT:1900i, set to ship in mid-2007.
In combination with low k1 capabilities, ASML said that its new next-generation 193nm immersion lithography system extends optical lithography for volume production to 40nm and below. The company added that the system delivers a new industry numerical aperture (NA) benchmark of 1.35, the near practical limit for water-based immersion technology...
...the XT:1900i will specifically enable volume production for logic devices down to 32nm and memory devices at 40nm and below...
guiding_light
9th August 2006 - 01:19 AM
QUOTE
ASML Holding NV has debuted what it says is the chip industry's most advanced lithography system, the ASML TWINSCAN XT:1900i, set to ship in mid-2007.
In combination with low k1 capabilities, ASML said that its new next-generation 193nm immersion lithography system extends optical lithography for volume production to 40nm and below. The company added that the system delivers a new industry numerical aperture (NA) benchmark of 1.35, the near practical limit for water-based immersion technology...
...the XT:1900i will specifically enable volume production for logic devices down to 32nm and memory devices at 40nm and below...
Obviously ASML wants to score as much revenue as possible from this tool.
guiding_light
30th November 2007 - 02:40 PM
game over.
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