QUOTE (nanomvp+May 1 2009, 05:00 PM)
Yeah especially if it's for a SEM we are supposed to expect secondary electrons to come shooting up from a bombarded surface. So I wonder if we can't just measure power consumed at the electron gun.
That is the total emission current, but usually the blanking aperture cuts off most of it to allow the beam to be focused to smaller spot.
guiding_light
1st May 2009 - 06:16 PM
Besides secondaries, the backscattering electrons are more dangerous since they can escape through the beam entry point.
nanomvp
3rd May 2009 - 05:45 PM
How about X-rays from the electron beam striking the target? The X-rays then go on to release electrons elsewhere, changing the charge balance.
guiding_light
4th May 2009 - 11:53 AM
QUOTE (nanomvp+May 3 2009, 05:45 PM)
How about X-rays from the electron beam striking the target? The X-rays then go on to release electrons elsewhere, changing the charge balance.
Once again, a beautiful opportunity for a thought experiment.
Let's consider that only one primary electron is incident on the Faraday cup. On the first strike, it produces many secondary electrons and is itself backscattered. It could be backscattered several more times before finally getting stuck in the wall. But all the secondary electrons are collected back as well. We should register just one count for the incident electron, but how many do we get in all the commotion and in how much time?
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